I study nanoscale science, through the use of a scanning probe microscope (SPM). A small cantilever and tip (tip radius = 10 nm) is brought close to or in contact with a surface to measure local properties. Topography, magnetism, hardness, conductivity, and much more can be locally mapped out in this way. There are applications to materials science, device physics, and cell biology, to name just a few.

Please contact me if you wish to learn more.  

Research website

CV (updated Jan 2012)

Awards and Honors:  

Presidential Early Career Award for Scientists and Engineers (PECASE), 2010.

NSF Faculty Early CAREER Development Award, 2010.